FDTD boundary condition 질문 드립니다.
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현재 FDTD를 사용하여 silicon nanowire array의 optical spectrum을 관찰하고 있습니다.
질문드리고 싶은 부분은 silicon nanowire array의 pitch를 조절할 때 FDTD x & y span을 통해 조절하고 있습니다.
그런데 wire pitch와 동일한 wavelength에서는, 아래의 그림과 같이 인위적인 spectrum이 관찰되고 있습니다.
예상과 다르다기보단, 특정 파장 영역에서만 noise가 굉장히 심하게 보입니다.
쉽게 말해, 빨간색 박스 안의 spectrum이, 빨간색 박스 외의 spectrum보다 noise가 심하게 보입니다.
그런데 Noise가 발생하는 파장과 FDTD x & y span과 동일하다는 것입니다.
FDTD x& y span을 500 nm로 설정할 경우, 500 nm 파장 영역에서만 Noise가 특히 심해집니다.
아래 BC의 geometery 정보를 첨부하여 드립니다.
감사합니다.
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